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Micro-Electronics and Telecommunication Engineering: Proceedings of 6th ICMETE 2022

Posted By: AvaxGenius
Micro-Electronics and Telecommunication Engineering: Proceedings of 6th ICMETE 2022

Micro-Electronics and Telecommunication Engineering: Proceedings of 6th ICMETE 2022 by Devendra Kumar Sharma, Sheng-Lung Peng, Rohit Sharma, Gwanggil Jeon
English | EPUB (True) | 2023 | 676 Pages | ISBN : 9811995117 | 82.8 MB

The book presents high-quality papers from the Sixth International Conference on Microelectronics and Telecommunication Engineering (ICMETE 2022). It discusses the latest technological trends and advances in major research areas such as microelectronics, wireless communications, optical communication, signal processing, image processing, big data, cloud computing, artificial intelligence, and sensor network applications. This book includes the contributions of national and international scientists, researchers, and engineers from both academia and the industry. The contents of this book are useful to researchers, professionals, and students alike.

Computational Intelligence, Communications, and Business Analytics (Repost)

Posted By: AvaxGenius
Computational Intelligence, Communications, and Business Analytics (Repost)

Computational Intelligence, Communications, and Business Analytics: First International Conference, CICBA 2017, Kolkata, India, March 24 – 25, 2017, Revised Selected Papers, Part II By J. K. Mandal, Paramartha Dutta, Somnath Mukhopadhyay
English | PDF | 2017 | 652 Pages | ISBN : 9811064296 | 96.6 MB

The two volume set CCIS 775 and 776 constitutes the refereed proceedings of the First International Conference on Computational Intelligence, Communications, and Business Analytics, CICBA 2017, held in Kolkata, India, in March 2017.

Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Posted By: AvaxGenius
Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Integrated Circuit Defect-Sensitivity: Theory and Computational Models by José Pineda de Gyvez
English | PDF | 1993 | 181 Pages | ISBN : 0792393066 | 13.74 MB

The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers.